TY - GEN
T1 - Characterization and classification of flaws in PAUT using a convolutional neural network
AU - Lombard, Eloi
AU - Bélanger, Pierre
N1 - Publisher Copyright:
© 2025 SPIE.
PY - 2025
Y1 - 2025
N2 - Phased Array Ultrasonic Testing (PAUT) is widely used in non destructive testing (NDT) for defect detection and characterization. However, interpreting PAUT data requires significant expertise, and results may vary depending on the inspector, especially when the weld geometry introduces artifacts that add complexity to the analysis. To address these challenges, this study employs a Faster R-CNN architecture to automate flaw detection and sizing. The impact of incorporating contextual information into the dataset is investigated, comparing raw images, with overlayed geometry, and a geometry subtraction techniques. The results demonstrate that enhancing the context improves accuracy and is necessary when adressing a challenging dataset.
AB - Phased Array Ultrasonic Testing (PAUT) is widely used in non destructive testing (NDT) for defect detection and characterization. However, interpreting PAUT data requires significant expertise, and results may vary depending on the inspector, especially when the weld geometry introduces artifacts that add complexity to the analysis. To address these challenges, this study employs a Faster R-CNN architecture to automate flaw detection and sizing. The impact of incorporating contextual information into the dataset is investigated, comparing raw images, with overlayed geometry, and a geometry subtraction techniques. The results demonstrate that enhancing the context improves accuracy and is necessary when adressing a challenging dataset.
UR - https://www.scopus.com/pages/publications/105014763958
U2 - 10.1117/12.3051140
DO - 10.1117/12.3051140
M3 - Contribution to conference proceedings
AN - SCOPUS:105014763958
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Digital Twins, AI, and NDE for Industry Applications and Energy Systems 2025
A2 - Niezrecki, Christopher
A2 - Farhangdoust, Saman
PB - SPIE
T2 - Digital Twins, AI, and NDE for Industry Applications and Energy Systems 2025
Y2 - 17 March 2025 through 20 March 2025
ER -