Characterization and Polarization Sensitivity Analysis of CMOS Terahertz Detector

Redwan Ahmad; Francois Blanchard; Richard Al Hadi

doi:10.1109/PN66844.2025.11097144

Characterization and Polarization Sensitivity Analysis of CMOS Terahertz Detector

École de technologie supérieure

Research output: Contribution to Book/Report types › Contribution to conference proceedings › peer-review

Abstract

In this study, we used a tunable continuous wave (CW) terahertz (THz) source to characterize a THz detector based on CMOS (complementary metal-oxide-semiconductor) technology. To determine the polarization sensitivity of the detected response, the emitted THz polarization was set parallel, and 45° to the detector orientation respectively. Experimental results show that a broadband response of 0.110 THz to 0.80 THz is obtained when the transmitter and detector are oriented parallel to each other. Our results demonstrate that this detector will be useful for imaging and spectroscopy applications, as well as for polarimetric measurement with a wide THz bandwidth.

Original language	English
Title of host publication	2025 Photonics North, PN 2025
Publisher	Institute of Electrical and Electronics Engineers Inc.
Edition	2025
ISBN (Electronic)	9798331556235
DOIs	https://doi.org/10.1109/PN66844.2025.11097144
Publication status	Published - 2025
Event	2025 Photonics North, PN 2025 - Ottawa, Canada Duration: 20 May 2025 → 23 May 2025

Conference

Conference	2025 Photonics North, PN 2025
Country/Territory	Canada
City	Ottawa
Period	20/05/25 → 23/05/25

!!!Keywords

CMOS terahertz detector
CW THz source
spectrometer

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10.1109/PN66844.2025.11097144

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@inproceedings{1b8467d9a69e4ea9ae1715a5e380eaad,

title = "Characterization and Polarization Sensitivity Analysis of CMOS Terahertz Detector",

abstract = "In this study, we used a tunable continuous wave (CW) terahertz (THz) source to characterize a THz detector based on CMOS (complementary metal-oxide-semiconductor) technology. To determine the polarization sensitivity of the detected response, the emitted THz polarization was set parallel, and 45° to the detector orientation respectively. Experimental results show that a broadband response of 0.110 THz to 0.80 THz is obtained when the transmitter and detector are oriented parallel to each other. Our results demonstrate that this detector will be useful for imaging and spectroscopy applications, as well as for polarimetric measurement with a wide THz bandwidth.",

keywords = "CMOS terahertz detector, CW THz source, spectrometer",

author = "Redwan Ahmad and Francois Blanchard and \{Al Hadi\}, Richard",

note = "Publisher Copyright: {\textcopyright} 2025 IEEE.; 2025 Photonics North, PN 2025 ; Conference date: 20-05-2025 Through 23-05-2025",

year = "2025",

doi = "10.1109/PN66844.2025.11097144",

language = "English",

booktitle = "2025 Photonics North, PN 2025",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

edition = "2025",

}

TY - GEN

T1 - Characterization and Polarization Sensitivity Analysis of CMOS Terahertz Detector

AU - Ahmad, Redwan

AU - Blanchard, Francois

AU - Al Hadi, Richard

PY - 2025

Y1 - 2025

N2 - In this study, we used a tunable continuous wave (CW) terahertz (THz) source to characterize a THz detector based on CMOS (complementary metal-oxide-semiconductor) technology. To determine the polarization sensitivity of the detected response, the emitted THz polarization was set parallel, and 45° to the detector orientation respectively. Experimental results show that a broadband response of 0.110 THz to 0.80 THz is obtained when the transmitter and detector are oriented parallel to each other. Our results demonstrate that this detector will be useful for imaging and spectroscopy applications, as well as for polarimetric measurement with a wide THz bandwidth.

AB - In this study, we used a tunable continuous wave (CW) terahertz (THz) source to characterize a THz detector based on CMOS (complementary metal-oxide-semiconductor) technology. To determine the polarization sensitivity of the detected response, the emitted THz polarization was set parallel, and 45° to the detector orientation respectively. Experimental results show that a broadband response of 0.110 THz to 0.80 THz is obtained when the transmitter and detector are oriented parallel to each other. Our results demonstrate that this detector will be useful for imaging and spectroscopy applications, as well as for polarimetric measurement with a wide THz bandwidth.

KW - CMOS terahertz detector

KW - CW THz source

KW - spectrometer

UR - https://www.scopus.com/pages/publications/105022480140

U2 - 10.1109/PN66844.2025.11097144

DO - 10.1109/PN66844.2025.11097144

M3 - Contribution to conference proceedings

AN - SCOPUS:105022480140

BT - 2025 Photonics North, PN 2025

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2025 Photonics North, PN 2025

Y2 - 20 May 2025 through 23 May 2025

ER -

Characterization and Polarization Sensitivity Analysis of CMOS Terahertz Detector

Abstract

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!!!Keywords

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