Inverted Scanning Microwave Microscopy of GaN/AlN High-Electron Mobility Transistors
- Xiaopeng Wang
- , Kazuki Nomoto
- , Gianluca Fabi
- , Richard Al Hadi
- , Marco Farina
- , Debdeep Jena
- , Huili Grace Xing
- , James C.M. Hwang
Research output: Contribution to Book/Report types › Contribution to conference proceedings › peer-review
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Citation
(Scopus)