Inverted Scanning Microwave Microscopy of GaN/AlN High-Electron Mobility Transistors

  • Xiaopeng Wang
  • , Kazuki Nomoto
  • , Gianluca Fabi
  • , Richard Al Hadi
  • , Marco Farina
  • , Debdeep Jena
  • , Huili Grace Xing
  • , James C.M. Hwang

Research output: Contribution to Book/Report types › Contribution to conference proceedings › peer-review

1 Citation (Scopus)

Fingerprint

Dive into the research topics of 'Inverted Scanning Microwave Microscopy of GaN/AlN High-Electron Mobility Transistors'. Together they form a unique fingerprint.

Keyphrases

Engineering

Earth and Planetary Sciences