NTIRE 2025 Challenge on HR Depth From Images of Specular and Transparent Surfaces

  • Pierluigi Zama Ramirez
  • , Fabio Tosi
  • , Luigi Di Stefano
  • , Radu Timofte
  • , Alex Costanzino
  • , Matteo Poggi
  • , Samuele Salti
  • , Stefano Mattoccia
  • , Zhe Zhang
  • , Yang Yang
  • , Wu Chen
  • , Anlong Ming
  • , Mingshuai Zhao
  • , Mengying Yu
  • , Shida Gao
  • , Xiangfeng Wang
  • , Feng Xue
  • , Jun Shi
  • , Yong Yang
  • , A. Yong
  • Yixiang Jin, Dingzhe Li, Aryan Shukla, Liam Frija-Altarac, Matthew Toews, Hui Geng, Tianjiao Wan, Zijian Gao, Qisheng Xu, Kele Xu, Zijian Zang, Jameer Babu Pinjari, Kuldeep Purohit, Mykola Lavreniuk, Jing Cao, Shenyi Li, Kui Jiang, Junjun Jiang, Y. Huang

Research output: Contribution to Book/Report typesContribution to conference proceedingspeer-review

25 Citations (Scopus)

Abstract

This paper reports on the NTIRE 2025 challenge on HR Depth From images of Specular and Transparent surfaces, held in conjunction with the New Trends in Image Restoration and Enhancement (NTIRE) workshop at CVPR 2025. This challenge aims to advance the research on depth estimation, specifically to address two of the main open issues in the field: high-resolution and non-Lambertian surfaces. The challenge proposes two tracks on stereo and single-image depth estimation, attracting about 177 registered participants. In the final testing stage, 4 and 4 participating teams submitted their models and fact sheets for the two tracks.

Original languageEnglish
Title of host publicationProceedings - 2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2025
PublisherIEEE Computer Society
Pages978-992
Number of pages15
ISBN (Electronic)9798331599942
DOIs
Publication statusPublished - 2025
Event2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2025 - Nashville, United States
Duration: 11 Jun 202512 Jun 2025

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2025
Country/TerritoryUnited States
CityNashville
Period11/06/2512/06/25

!!!Keywords

  • challenge
  • depth
  • mono
  • stereo
  • transparent

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