Characterization and Polarization Sensitivity Analysis of CMOS Terahertz Detector

Redwan Ahmad; Francois Blanchard; Richard Al Hadi

doi:10.1109/PN66844.2025.11097144

Characterization and Polarization Sensitivity Analysis of CMOS Terahertz Detector

École de technologie supérieure

Résultats de recherche: Chapitre dans un livre, rapport, actes de conférence › Participation à un ouvrage collectif lié à un colloque ou une conférence › Revue par des pairs

Résumé

In this study, we used a tunable continuous wave (CW) terahertz (THz) source to characterize a THz detector based on CMOS (complementary metal-oxide-semiconductor) technology. To determine the polarization sensitivity of the detected response, the emitted THz polarization was set parallel, and 45° to the detector orientation respectively. Experimental results show that a broadband response of 0.110 THz to 0.80 THz is obtained when the transmitter and detector are oriented parallel to each other. Our results demonstrate that this detector will be useful for imaging and spectroscopy applications, as well as for polarimetric measurement with a wide THz bandwidth.

langue originale	Anglais
titre	2025 Photonics North, PN 2025
Editeur	Institute of Electrical and Electronics Engineers Inc.
Edition	2025
ISBN (Electronique)	9798331556235
Les DOIs	https://doi.org/10.1109/PN66844.2025.11097144
état	Publié - 2025
Evénement	2025 Photonics North, PN 2025 - Ottawa, Canada Durée: 20 mai 2025 → 23 mai 2025

Conférence

Conférence	2025 Photonics North, PN 2025
Pays/Territoire	Canada
La ville	Ottawa
période	20/05/25 → 23/05/25

Accès au document

10.1109/PN66844.2025.11097144

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Voici les principaux termes ou expressions associés à « Characterization and Polarization Sensitivity Analysis of CMOS Terahertz Detector ». Ces libellés thématiques sont générés à partir du titre et du résumé de la publication. Ensemble, ils forment une empreinte digitale unique.

Contient cette citation

@inproceedings{1b8467d9a69e4ea9ae1715a5e380eaad,

title = "Characterization and Polarization Sensitivity Analysis of CMOS Terahertz Detector",

abstract = "In this study, we used a tunable continuous wave (CW) terahertz (THz) source to characterize a THz detector based on CMOS (complementary metal-oxide-semiconductor) technology. To determine the polarization sensitivity of the detected response, the emitted THz polarization was set parallel, and 45° to the detector orientation respectively. Experimental results show that a broadband response of 0.110 THz to 0.80 THz is obtained when the transmitter and detector are oriented parallel to each other. Our results demonstrate that this detector will be useful for imaging and spectroscopy applications, as well as for polarimetric measurement with a wide THz bandwidth.",

keywords = "CMOS terahertz detector, CW THz source, spectrometer",

author = "Redwan Ahmad and Francois Blanchard and \{Al Hadi\}, Richard",

note = "Publisher Copyright: {\textcopyright} 2025 IEEE.; 2025 Photonics North, PN 2025 ; Conference date: 20-05-2025 Through 23-05-2025",

year = "2025",

doi = "10.1109/PN66844.2025.11097144",

language = "English",

booktitle = "2025 Photonics North, PN 2025",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

edition = "2025",

}

Characterization and Polarization Sensitivity Analysis of CMOS Terahertz Detector. / Ahmad, Redwan; Blanchard, Francois ; Al Hadi, Richard.
2025 Photonics North, PN 2025. 2025. Ed. Institute of Electrical and Electronics Engineers Inc., 2025.

Résultats de recherche: Chapitre dans un livre, rapport, actes de conférence › Participation à un ouvrage collectif lié à un colloque ou une conférence › Revue par des pairs

TY - GEN

T1 - Characterization and Polarization Sensitivity Analysis of CMOS Terahertz Detector

AU - Ahmad, Redwan

AU - Blanchard, Francois

AU - Al Hadi, Richard

PY - 2025

Y1 - 2025

N2 - In this study, we used a tunable continuous wave (CW) terahertz (THz) source to characterize a THz detector based on CMOS (complementary metal-oxide-semiconductor) technology. To determine the polarization sensitivity of the detected response, the emitted THz polarization was set parallel, and 45° to the detector orientation respectively. Experimental results show that a broadband response of 0.110 THz to 0.80 THz is obtained when the transmitter and detector are oriented parallel to each other. Our results demonstrate that this detector will be useful for imaging and spectroscopy applications, as well as for polarimetric measurement with a wide THz bandwidth.

AB - In this study, we used a tunable continuous wave (CW) terahertz (THz) source to characterize a THz detector based on CMOS (complementary metal-oxide-semiconductor) technology. To determine the polarization sensitivity of the detected response, the emitted THz polarization was set parallel, and 45° to the detector orientation respectively. Experimental results show that a broadband response of 0.110 THz to 0.80 THz is obtained when the transmitter and detector are oriented parallel to each other. Our results demonstrate that this detector will be useful for imaging and spectroscopy applications, as well as for polarimetric measurement with a wide THz bandwidth.

KW - CMOS terahertz detector

KW - CW THz source

KW - spectrometer

UR - https://www.scopus.com/pages/publications/105022480140

U2 - 10.1109/PN66844.2025.11097144

DO - 10.1109/PN66844.2025.11097144

M3 - Contribution to conference proceedings

AN - SCOPUS:105022480140

BT - 2025 Photonics North, PN 2025

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2025 Photonics North, PN 2025

Y2 - 20 May 2025 through 23 May 2025

ER -