Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage

Keyphrases

• Test Quality 100%
• Clock Frequency 100%
• Small Delay Defects 100%
• Speed Choice 100%
• Optimization Methods 18%
• At-speed 18%
• Transition Delay Fault 18%
• Pattern Sets 18%
• Reliability Failure 18%
• Optimization Techniques 9%
• Fault Model 9%
• Test Pattern 9%
• Relative Improvement 9%
• Benchmark Circuits 9%
• Test Quality Metrics 9%
• At-speed Test 9%
• Delay Test 9%
• Pattern Count 9%
• Self-timed Circuit 9%
• Circuit Reliability 9%
• Delay Faults 9%
• Post-silicon 9%

Engineering

• Clock Speed 100%
• Optimization Method 66%
• Reliability Defect 66%
• Metrics 33%
• Optimization Technique 33%
• Fault Model 33%
• Test Result 33%