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Generalized Thru-Reflect-Line Calibration for 1-220-GHz Single-Sweep Ultra-Wideband On-Wafer Measurement

  • Antonio Morini
  • , Marco Farina
  • , Richard Al Hadi
  • , Tianze Li
  • , Xinghao Tong
  • , Lei Li
  • , James C.M. Hwang
  • Marche Polytechnic University
  • Cornell University
  • Montreal Graduate School of Technology

Research output: Contribution to Book/Report types › Contribution to conference proceedings › peer-review

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