@inproceedings{ef78ada42b8544648a3f4950b681eb9e,
title = "Programmable Impulse and Random Noise Generation Circuit for Power Integrity Tests",
abstract = "A novel, fully programmable noise-generation circuit is proposed for injecting random high-voltage impulses and random noise bursts, separately or combined, directly into a regulated power supply rail. It is intended as a minimally-invasive approach for assessing the impact of power supply noise on the performance of high-reliability electronic systems. The proposed circuit is made up of a high-output-current amplifier driving a pulse transformer that may be switched in or out of the DC supply path. It addresses the challenge of injecting high-voltage impulses into a regulated power rail that exhibits a very low impedance, and its small-footprint and low-cost make it suitable for System-in-Package applications requiring embedded tests. Simulation results indicates that the proposed noise source circuit successfully injects 5V random impulses of microsecond-width and 20mV random noise bursts into a high-voltage, high-current regulated power supply rail while adding very low extra power consumption.",
keywords = "impulse noise, noise injection, power supply, random noise, signal integrity",
author = "Piraghaj, \{Sudabeh Fotoohi\} and Constantin, \{Nicolas G.\}",
note = "Publisher Copyright: {\textcopyright} 2025 IEEE.; 38th IEEE International System-on-Chip Conference, SOCC 2025 ; Conference date: 29-09-2025 Through 01-10-2025",
year = "2025",
doi = "10.1109/SOCC66126.2025.11235408",
language = "English",
series = "International System on Chip Conference",
publisher = "IEEE Computer Society",
editor = "Danella Zhao and Klaus Hofmann",
booktitle = "Proceedings - 2025 IEEE 38th International System-on-Chip Conference, SOCC 2025",
}