Time-Resolved Mapping of Charge Carrier Dynamics and Defect-Mediated Migration Barriers in TiO₂

Material Science

• Activation Energy 50%
• Atomic Force Microscopy 50%
• Charge Carrier 100%
• Defect Engineering 50%
• Memory Effect 50%
• Metal Oxide 50%
• Oxide Compound 50%
• Surface (Surface Science) 50%
• Surface Defect 50%
• Thermal Management 50%
• Titanium Dioxide 100%

Keyphrases

• Carrier Migration 50%
• Carrier Relaxation 50%
• Local Defect 50%
• Low Migration 50%
• Migration Time 50%
• Nanoscale Charge Transport 50%
• Spatiotemporal Behavior 50%
• Surface Irradiation 50%
• Thermal Activation 50%
• Tunable Interactions 50%

Engineering

• Induced Surface 50%