Compact Terahertz Polarization-Resolved Measurements Using Frequency-Selective Intensity Detection

Redwan Ahmad; Charles Simard; Rejeena R. Sebastian; Jonathan Lafreniere-Greig; Xavier Ropagnol; Francois Blanchard

doi:10.1109/PN70808.2026.11657667

Compact Terahertz Polarization-Resolved Measurements Using Frequency-Selective Intensity Detection

Redwan Ahmad
, Charles Simard
, Rejeena R. Sebastian
, Jonathan Lafreniere-Greig
, Xavier Ropagnol
, Francois Blanchard

Department of Electrical Engineering
École de technologie supérieure
Institut national de la recherche scientifique

Research output: Contribution to journal › Conference article › peer-review

Abstract

We present a compact terahertz polarization-resolved measurement approach based on frequency-dependent intensity modulation using frequency-selective surfaces, enabling retrieval of polarimetric parameters including the Stokes parameters and the corresponding angle of linear polarization. System performance is validated through controlled wire-grid polarizer rotation and optimization-assisted comparison with numerical simulations. The proposed approach highlights its potential for polarimetric imaging of anisotropic samples, material characterization, and nondestructive evaluation.

Original language	English
Journal	Photonics North, PN
Issue number	2026
DOIs	https://doi.org/10.1109/PN70808.2026.11657667
Publication status	Published - 2026
Event	2026 Photonics North, PN 2026 - Quebec City, Canada Duration: 2 Jun 2026 → 5 Jun 2026

!!!Keywords

Polarization-sensitive frequency-selective surface
terahertz polarimetric system

Access to Document

10.1109/PN70808.2026.11657667

Cite this

@article{608a65f91bb144208c19c55111ea2439,

title = "Compact Terahertz Polarization-Resolved Measurements Using Frequency-Selective Intensity Detection",

abstract = "We present a compact terahertz polarization-resolved measurement approach based on frequency-dependent intensity modulation using frequency-selective surfaces, enabling retrieval of polarimetric parameters including the Stokes parameters and the corresponding angle of linear polarization. System performance is validated through controlled wire-grid polarizer rotation and optimization-assisted comparison with numerical simulations. The proposed approach highlights its potential for polarimetric imaging of anisotropic samples, material characterization, and nondestructive evaluation.",

keywords = "Polarization-sensitive frequency-selective surface, terahertz polarimetric system",

author = "Redwan Ahmad and Charles Simard and Sebastian, \{Rejeena R.\} and Jonathan Lafreniere-Greig and Xavier Ropagnol and Francois Blanchard",

note = "Publisher Copyright: {\textcopyright} 2026 IEEE.; 2026 Photonics North, PN 2026 ; Conference date: 02-06-2026 Through 05-06-2026",

year = "2026",

doi = "10.1109/PN70808.2026.11657667",

language = "English",

journal = "Photonics North, PN",

issn = "2693-8324",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "2026",

}

TY - JOUR

T1 - Compact Terahertz Polarization-Resolved Measurements Using Frequency-Selective Intensity Detection

AU - Ahmad, Redwan

AU - Simard, Charles

AU - Sebastian, Rejeena R.

AU - Lafreniere-Greig, Jonathan

AU - Ropagnol, Xavier

AU - Blanchard, Francois

PY - 2026

Y1 - 2026

N2 - We present a compact terahertz polarization-resolved measurement approach based on frequency-dependent intensity modulation using frequency-selective surfaces, enabling retrieval of polarimetric parameters including the Stokes parameters and the corresponding angle of linear polarization. System performance is validated through controlled wire-grid polarizer rotation and optimization-assisted comparison with numerical simulations. The proposed approach highlights its potential for polarimetric imaging of anisotropic samples, material characterization, and nondestructive evaluation.

AB - We present a compact terahertz polarization-resolved measurement approach based on frequency-dependent intensity modulation using frequency-selective surfaces, enabling retrieval of polarimetric parameters including the Stokes parameters and the corresponding angle of linear polarization. System performance is validated through controlled wire-grid polarizer rotation and optimization-assisted comparison with numerical simulations. The proposed approach highlights its potential for polarimetric imaging of anisotropic samples, material characterization, and nondestructive evaluation.

KW - Polarization-sensitive frequency-selective surface

KW - terahertz polarimetric system

UR - https://www.scopus.com/pages/publications/105049063754

U2 - 10.1109/PN70808.2026.11657667

DO - 10.1109/PN70808.2026.11657667

M3 - Conference article

AN - SCOPUS:105049063754

SN - 2693-8324

JO - Photonics North, PN

JF - Photonics North, PN

IS - 2026

T2 - 2026 Photonics North, PN 2026

Y2 - 2 June 2026 through 5 June 2026

ER -

Compact Terahertz Polarization-Resolved Measurements Using Frequency-Selective Intensity Detection

Abstract

!!!Keywords

Access to Document

Other files and links

Fingerprint

Cite this