Compact Terahertz Polarization-Resolved Measurements Using Frequency-Selective Intensity Detection

Redwan Ahmad; Charles Simard; Rejeena R. Sebastian; Jonathan Lafreniere-Greig; Xavier Ropagnol; Francois Blanchard

doi:10.1109/PN70808.2026.11657667

Compact Terahertz Polarization-Resolved Measurements Using Frequency-Selective Intensity Detection

Redwan Ahmad
, Charles Simard
, Rejeena R. Sebastian
, Jonathan Lafreniere-Greig
, Xavier Ropagnol
, Francois Blanchard

Department of Electrical Engineering
École de technologie supérieure
Institut national de la recherche scientifique

Résultats de recherche: Contribution à un journal › Article de conférence › Revue par des pairs

Résumé

We present a compact terahertz polarization-resolved measurement approach based on frequency-dependent intensity modulation using frequency-selective surfaces, enabling retrieval of polarimetric parameters including the Stokes parameters and the corresponding angle of linear polarization. System performance is validated through controlled wire-grid polarizer rotation and optimization-assisted comparison with numerical simulations. The proposed approach highlights its potential for polarimetric imaging of anisotropic samples, material characterization, and nondestructive evaluation.

langue originale	Anglais
journal	Photonics North, PN
Numéro de publication	2026
Les DOIs	https://doi.org/10.1109/PN70808.2026.11657667
état	Publié - 2026
Evénement	2026 Photonics North, PN 2026 - Quebec City, Canada Durée: 2 juin 2026 → 5 juin 2026

Accès au document

10.1109/PN70808.2026.11657667

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abstract = "We present a compact terahertz polarization-resolved measurement approach based on frequency-dependent intensity modulation using frequency-selective surfaces, enabling retrieval of polarimetric parameters including the Stokes parameters and the corresponding angle of linear polarization. System performance is validated through controlled wire-grid polarizer rotation and optimization-assisted comparison with numerical simulations. The proposed approach highlights its potential for polarimetric imaging of anisotropic samples, material characterization, and nondestructive evaluation.",

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AU - Ropagnol, Xavier

AU - Blanchard, Francois

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AB - We present a compact terahertz polarization-resolved measurement approach based on frequency-dependent intensity modulation using frequency-selective surfaces, enabling retrieval of polarimetric parameters including the Stokes parameters and the corresponding angle of linear polarization. System performance is validated through controlled wire-grid polarizer rotation and optimization-assisted comparison with numerical simulations. The proposed approach highlights its potential for polarimetric imaging of anisotropic samples, material characterization, and nondestructive evaluation.

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KW - terahertz polarimetric system

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