Émulation et comparaison du mode test et du mode fonctionnel des circuits intégrés à horloges multiples

Abstract

This thesis studies the representativeness of the scan based at-speed test (SBAST) versus the functional mode in terms of delays and supply voltage. In the literature, the efforts made to verify if the test mode is representative are related almost exclusively to the test mode itself, the functional mode being considered as a stable reference. From preliminary experiments (Thibeault and Larche 2012), we noticed that the functional mode with multiple clock domains brings undesirable fluctuations called intermodulation products (IMPs), up to now unexplored in this context. One of the objectives of this research is the study of the IMP effects on the propagation delays and on the supply voltage. In order to achieve the goals of the research, a test environment is proposed. This environment includes a tester and a circuit under test (CUT). At the same time, we studied the impact of the presence of a tester in the same device as the CUT. The results obtained demonstrate that under certain frequency limits, the SBAST is not representative of the functional mode. This is mainly due to the IMPs in the functional mode with multiple clock domains that are not present in the test mode, because the clocks are not distributed during that mode. We also conclude that the IMPs in the functional mode have an impact on the propagation delays and on the supply voltage. Finally, according to our experiments, the tester, thus the test clock generation, has an impact on the propagation delay.

Date	17 Jan 2013
Original language	French
Awarding Institution	École de technologie supérieure
Supervisor	Claude Thibeault (Supervisor) & Yvon Savaria (Co-supervisor)