Mise en œuvre et caractérisation d'une méthode d'injection de pannes à haut niveau d'abstraction

Abstract

Nowadays, the effects of cosmic rays on electronics are well known. Different studies have demonstrated that neutrons are the main cause of non-destructive errors in embedded circuits on airplanes. Moreover, the reduction of transistor sizes is making all circuits more sensitive to those effects. Radiation tolerant circuits are sometimes used in order to improve the robustness of circuits. However, those circuits are expensive and their technologies often lag a few generations behind compared to non-tolerant circuits. Designers prefer to use conventional circuits with mitigation techniques to improve the tolerance to soft errors. It is necessary to analyse and verify the dependability of a circuit throughout its design process. Conventional design methodologies need to be adapted in order to evaluate the tolerance to non-destructive errors caused by radiations. Nowadays, designers need new Tools and new methodologies to validate their mitigation strategies if they are to meet system requirements. In this thesis, we are proposing a new methodology allowing to capture the faulty behavior of a circuit at a low level of abstraction and to apply it at a higher level. In order to do that, we are introducing the new concept of faulty behavior Signatures that allows creating, at a high level of abstraction (system level) models that reflect with high fidelity the faulty behavior of a circuit learned at a low level of abstraction, at gate level. We successfully replicated the faulty behavior of an 8 bit adder and multiplier with Simulink, with respectively a correlation coefficient of 98.53% and 99.86%. We are proposing a methodology that permits to generate a library of faulty components, with Simulink, allowing designers to verify the dependability of their models early in the design flow. We are presenting and analyzing our results obtained for three different circuits throughout this thesis. Within the framework of this project a paper was published at the NEWCAS 2013 conference (Robache et al., 2013). This works presents the new concept of faulty behavior Signature, the methodology for generating Signatures we developed and also our experiments with an 8bit multiplier.

Date	19 Sept 2013
Original language	French
Awarding Institution	École de technologie supérieure
Supervisor	Jean-François Boland (Supervisor) & Yvon Savaria (Co-supervisor)