TY - GEN
T1 - Generalized Thru-Reflect-Line Calibration for 1-220-GHz Single-Sweep Ultra-Wideband On-Wafer Measurement
AU - Morini, Antonio
AU - Farina, Marco
AU - Al Hadi, Richard
AU - Li, Tianze
AU - Tong, Xinghao
AU - Li, Lei
AU - Hwang, James C.M.
N1 - Publisher Copyright:
© 2026 IEEE.
PY - 2026
Y1 - 2026
N2 - The Generalized Thru-Reflect-Line (GTRL) calibration technique was originally developed for multi-mode waveguides. This work explored the GTRL technique for single-tier calibration of on-wafer two-port measurement of a Grounded Coplanar Waveguide (GCPW) transmission line. The GCPW, fabricated on 50-μm-thick SiC, is intrinsically a single-mode device. In this case, the GTRL technique was found comparable to the conventional two-tier LRRM + TRL technique in calibrating the single-sweep ultra-wideband measurement from 1 to 170 GHz. Above 170 GHz, both techniques fail to capture the suck out due to direct probe-probe crosstalk. Nevertheless, this shows that the GTRL technique can at least converges for a single-mode device. It remains to be proven that by accounting for probe-probe crosstalk, the GTRL technique can better handle the GCPW when it becomes multimode.
AB - The Generalized Thru-Reflect-Line (GTRL) calibration technique was originally developed for multi-mode waveguides. This work explored the GTRL technique for single-tier calibration of on-wafer two-port measurement of a Grounded Coplanar Waveguide (GCPW) transmission line. The GCPW, fabricated on 50-μm-thick SiC, is intrinsically a single-mode device. In this case, the GTRL technique was found comparable to the conventional two-tier LRRM + TRL technique in calibrating the single-sweep ultra-wideband measurement from 1 to 170 GHz. Above 170 GHz, both techniques fail to capture the suck out due to direct probe-probe crosstalk. Nevertheless, this shows that the GTRL technique can at least converges for a single-mode device. It remains to be proven that by accounting for probe-probe crosstalk, the GTRL technique can better handle the GCPW when it becomes multimode.
KW - calibration
KW - microwave measurement
KW - millimeter-wave measurement
KW - monolithic microwave integrated circuit
KW - on-wafer measurement
UR - https://www.scopus.com/pages/publications/105047156614
U2 - 10.1109/IMSRFSA70221.2026.11624313
DO - 10.1109/IMSRFSA70221.2026.11624313
M3 - Contribution to conference proceedings
AN - SCOPUS:105047156614
T3 - 2026 IEEE MTT-S Radio Frequency Systems and Applications Symposium, IMS RFSA 2026
SP - 386
EP - 389
BT - 2026 IEEE MTT-S Radio Frequency Systems and Applications Symposium, IMS RFSA 2026
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2026 IEEE MTT-S Radio Frequency Systems and Applications Symposium, IMS RFSA 2026
Y2 - 7 June 2026 through 12 June 2026
ER -